Browse Government Grants
141 grants found
Evaluating Biometrics for a Cryptographic Application
Department of Commerce — National Institute of Standards and Technology
Feasibility and Proof of Concept of a Dense, Low Cost, Network of Sensors Driving Intelligent Building Agents for Air Quality and Energy Control
Department of Commerce — National Institute of Standards and Technology
Developing Data Standards for Accelerated Digital R&D of Semiconductor Materials from Nanoscale
Department of Commerce — National Institute of Standards and Technology
Sentinel 4.0TM: Measurement and Control System for 3DCP Interlayer Bond Strength
Department of Commerce — National Institute of Standards and Technology
Method for Quantifying Fitted Filtration Efficiency of Face Mask and Respirator Products
Department of Commerce — National Institute of Standards and Technology
Metabolite Reference Standards to Normalize Spatial Metabolomics Across Tissue Sections
Department of Commerce — National Institute of Standards and Technology
Gigahertz SEM-based Nanoprobes: Enabling Metrology, Failure Analysis, and Device Characterization for Next-Generation Semiconductor Node Manufacturing
Department of Commerce — National Institute of Standards and Technology – CHIPS
RF Channel Sounder for Automatic Acquisition of the Wireless Environment.
Department of Commerce — National Institute of Standards and Technology – CHIPS
Device-scale AFM Thermoreflectance metrology: Analytics, Probe design, machine Learning, User experience, and Standards (DATAPLUS)
Department of Commerce
Rapid and Accurate High-Resolution Ion Microscopy for Semiconductor Metrology
Department of Commerce — National Institute of Standards and Technology – CHIPS
Defining & deploying a reference implementation of the PCN Commercial Trust Protocol (CTP) to capture, manage, and license the verifiable credentials, metrology, and IP of the semiconductor industry.
Department of Commerce — National Institute of Standards and Technology – CHIPS
R&D to enable Scanning Microwave Impedance Microscopy for metrology in advanced FAB?s Measurement technology for in-line Metrology which has applications in materials purity, electrical properties
Department of Commerce — National Institute of Standards and Technology – CHIPS
Development of an In-Situ High Voltage Biasing Holder for the Transmission Electron Microscope
Department of Commerce — National Institute of Standards and Technology – CHIPS
Compact Cryogenics for Single-Photon Microscopy
Department of Commerce — National Institute of Standards and Technology – CHIPS
NeuroFAB – Unified AI Systems to Model Lithography and Computationally Intensive Critical Processes for Semiconductor Designers and Manufacturers
Department of Commerce — National Institute of Standards and Technology – CHIPS
Binary Pseudo Random Array (BPRA) Standards, Protocol, and Software for EUV Lithography Tool Enhancement
Department of Commerce — National Institute of Standards and Technology – CHIPS
Infrared Spectrometer for Semiconductor Process and Environmental Contaminant Testing in Realtime (INSPECTR)
Department of Commerce — National Institute of Standards and Technology – CHIPS
High-Resolution EBSD and TKD Direct Detection Camera
Department of Commerce — National Institute of Standards and Technology – CHIPS
NECTAR: Nanometrology for Enhanced Calibration and Transferability with Atomic References
Department of Commerce — National Institute of Standards and Technology – CHIPS
Gigahertz Optical Photothermal Infrared: high-speed sub-micron simultaneous super-resolution infrared chemical analysis and thermal property measurements
Department of Commerce — National Institute of Standards and Technology – CHIPS
Next-Gen RF Transistor Models for Ultra-Efficient RFICs
Department of Commerce — National Institute of Standards and Technology – CHIPS
Development of a Novel Linear Accumulating X-ray Source (LAXS) for CDSAXS
Department of Commerce — National Institute of Standards and Technology – CHIPS
A metrology-based signoff tool for photonics integrated circuit design
Department of Commerce — National Institute of Standards and Technology – CHIPS
Active Material Technology to Improve Solar Sail Performance for Space Weather Monitoring
Department of Commerce — National Oceanic and Atmospheric Administration